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  1. SIS - High Resolution Surface Inspection, SPM, AFM, Microscopy

    Welcome to Surface Imaging Systems For more than 10 years we have been developing atomic force and scanning probe microscopes (AFM / SPM) for the nanotechnology ...
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    sis-gmbh.com - 2009-02-06

  2. Microscopes Metrology Sales Service Calibration Repair

    Microscope Service Repair Calibration Alignment Sales TTV noncontact profiler metrology calibration alignment Olympus Nikon Leica Zeiss Ambios FRT AFM WLI ...
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    www.svms.com - 2009-02-05

wireless weather station1 metrology2 electronic3 atomic force microscopy1 calibration2 semiconductor2 afm1 nanotechnology2 electronics4 spm1 inspection3 equipment4

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